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Materials
Characterization
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A
full suite of facilities are available for the characterization and
preparation of various materials. |
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X-Ray Diffraction
Facilities:
• PANalytical 4 KW system for Laue back reflection
imaging of single crystals.
• PANalytical 3 KW X-Pert Pro system for polycrystalline
materials and powders.
Metrology Facilities:
Physical characterization of materials:
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Collimated light and laser alignment.
• Density determination.
• Flatness
and parallelism determination.
• Longitudinal and shear wave speed measurements.
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Micro-indentation hardness measurements.
• Optical microscopy.
• Differential scanning
calorimetry.
• Compression and tension
testing.
Sample Preparation Facilities:
•
Slow and high speed diamond and abrasive saws for
cutting, slicing, slotting, and wafering.
• High temperature programmable furnace and tube
furnace for heat treatment.
• Vacuum
deposition of metallic thin films.
Lapping and Polishing
Facilities:
Materials preparation for metals, single crystals, energetic crystals,
semi-conductors, polymers, and optical fibers.
Custom-sized optical windows and samples with thicknesses ranging from
10 microns to several centimeters for a variety of materials, from soft
materials (e.g. KCI, LiF and energetic crystals) to hard materials
(e.g. quartz, sapphire, silicon carbide and boron carbide).
Machine Shop:
The machine shop equipment includes a mill, lathes, drill presses, and
abrasive saws.
Additional University
Resources:
• Full-service Technical
Services shop with precision
machining capabilities.
• TEM and SEM / EBSD facilities and sputter deposition
equipment.
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